Systèmes d’analyse d’état de surface

 

 

 

 

 

 

La gamme Surface Metrology Mahr englobe les appareils de mesure de rugosité, ondulation et contours.
Ces mesures sont essentiellement basées sur la méthode du profil. Les profils 2D avec leurs paramètres associés sont documentés et calculés d’après les normes internationales.
Avec les équipements MarSurf, vous êtes à la pointe de la technologie car la réussite et le développement en sont les atouts !


MarSurf XR 1
MarSurf XR 1. The ideal instrument for a low-cost introduction to user-friendly surface metrology.
The PC-based instrument delivers all common surface parameters and profiles in accordance with international standards, both in the measuring room and in production. MarSurf XR 1 from Mahr stands for innovative roughness evaluation software.
Features
– Over 80 surface parameters for R-, P- and W-profiles according to current ISO/JIS or MOTIF standards (ISO 12085)
– Bandpass filter Ls in accordance with current standard; Ls can also be switched off or varied as required.
– Comprehensive measuring records
Teach-in methods for the rapid creation of Quick&Easy measuring programs
Automatic functions for choosing cut-off and traversing length in accordance with standards (patented)
– Support for various calibration methods (static and dynamic) by specifying the Ra or Rz parameter
– Adjustable maintenance and calibration intervals
– Multiple measuring station configurations for custom applications
– Range of options provide system flexibility
– Various user levels protect the device against misuse and prevent unauthorized people from using it

MarSurf XR 20 with GD25
MarSurf XR 20, the perfect introduction to top-class surface metrology.
The PC-based instrument delivers all common surface parameters and profiles in accordance with international standards, both in the measuring room and in production. The powerful MarSurf XR 20 combines decades of experience in surface metrology with innovative technology, easy-to-read icons and user-friendly operator assistance.

Key Features
– Over 100 surface parameters available for R-, P- and W-profiles in accordance with ISO / JIS, ASME or MOTIF (ISO 12085)
– Tolerance monitoring and statistics for all surface parameters
– Teach-in methods for the rapid creation of Quick&Easy measuring programs
– Comprehensive measuring records
– Automatic functions for choosing filter and traversing length in accordance with standards
– Support for various calibration methods (static/dynamic) by specifying the Ra or Rz parameter
– Adjustable maintenance and calibration intervals
– Simulation mode for rapid familiarization with operating principle
– Multiple measuring station configurations for custom applications


MarSurf XR 20 with GD120
MarSurf XR 20, the perfect introduction to top-class surface metrology.
The PC-based instrument delivers all common surface parameters and profiles in accordance with international standards, both in the measuring room and in production. The powerful MarSurf XR 20 combines decades of experience in surface metrology with innovative technology, easy-to-read icons and user-friendly operator assistance.
A sampling length of up to 120 mm is possible in conjunction with the GD 120 drive unit.
In addition to surface roughness evaluations, profile and waviness evaluations can also be performed in this way.

Key Features
– Over 100 surface parameters available for R-, P- and W-profiles in accordance with ISO / JIS, ASME or MOTIF (ISO 12085)
– Tolerance monitoring and statistics for all surface parameters
– Teach-in methods for the rapid creation of Quick&Easy measuring programs
– Comprehensive measuring records
– Automatic functions for choosing filter and traversing length in accordance with standards
– Support for various calibration methods (static/dynamic) by specifying the Ra or Rz parameter
– Adjustable maintenance and calibration intervals
– Simulation mode for rapid familiarization with operating principle
– Multiple measuring station configurations for custom applications


Marsurf UD120
MarSurf UD 120 is a high-end contour and roughness measuring station with integrated optical measuring system. Roughness and contour evaluations are calculated from a single profile. To carry out these two measuring tasks with just one measurement requires a highly accurate measuring system which can offer both the relatively large measuring stroke needed for contour measurement in radii, on slopes or on free-form surfaces and resolution in the nm range for surface roughness measurement.

Key Features
– The magnetic probe holder allows for a flexible choice of probes and rapid changeover, combined with excellent security
– Guaranteed positioning accuracy in the µm range when switching probes, along with collision protection, rigidity and probe stability #96 at nanometric resolutions
– A calibration method designed for maximum accuracy ensures reliable results
– Software-controlled, variably adjustable measuring forces remain constant over the entire measuring stroke for flexibility and safety. The optimal measuring force can be selected according to the material properties of the testpiece and the chosen probe
– The MarSurf X series offers morphological filtering for increased accuracy
Probe arm change with no need to recalibrate. The storage of calibration data for each arm and the magnetic probe holder ensure superb reproducibility


MarSurf UD130
MarSurf UD130 :The first step into high-precision roughness and contour metrology

Key Features
With the MarSurf UD130 Mahr has created the successor to the successful MarSurf UD120 and closed the gap between the high-end solution MarSurf LD130/LD260 and the standard combination measuring station MarSurf XCR20 with two drive units.


MarSurf LD130/260
MarSurf LD 130 / LD 260. A step into a new dimension !
Combined contour and roughness measurements in just one step come courtesy of proven cutting-edge technology from Mahr metrology. The MarSurf LD 130 and MarSurf LD 260 measuring stations have been systematically developed to draw on the experience from the first generation of equipment.

Key Features
– Roughness and contour in just one step
– High measuring and positioning speed cuts measuring times dramatically
– Innovative probe system removal
– Quick and reliable probe arm exchange with simultaneous probe arm detection by magnetic bracket
– Long measuring length up to 260 mm (MarSurf LD 260) with a measuring stroke of 13 mm (100 mm probe arm length) or 26 mm (200 mm probe arm length)
– Modular construction for ease of maintenance
– No need to fully dismantle the measuring stand for maintenance

MarSurf XR1

MarSurf XR20

MarSurf LD130/260

Souhaitez-vous plus d’informations sur cette gamme de solution? Souhaitez-vous une demonstration dédié à votre application? N’hésitez pas à nous contacter en cliquant ici!.